Professor Andrew Richardson

Professor

Profile

My work over the past 20 years has been focused around the semiconductor industry where I have mainly contributed to research in system design and test. I have worked on large digital chips with Philips Semiconductors (before it changed name to NXP), Mixed Signal and Analogue Designs with Austria Microsystems and AMI Semiconductors and on the integration of silicon sensors with ST Microelectronics. I have also become heavily involved in the field of bioelectronics through work on microfluidics with companies including EPIGEM UK and QinetiQ. I am heavily involved with several international conferences including the IEEE European Test Symposium (ETS), IEEE Design Automation & Test in Europe (DATE) and the IEEE International Mixed Signal, Sensors and System Test Workshop. Over the past few years I have become very interested in the applications of design and test technology to high reliability systems and the related manufacturing processes for miniaturised intelligent systems. My main focus here is on smart sensors for health & usage monitoring in aerospace, energy and environmental applications (with Centrica and ULTRA Electronics) and with the EPSRC Innovative Electronics Manufacturing Centre where I take the lead on Design for Test Engineering. I am also looking at adaptive systems and self-repair technologies for mixed signal systems with Dialog Semiconductor and for nano-mechanical switches with IBM. Finally, I also get heavily involved in continuing professional development. I run courses in both Digital and Analogue Design for Test for companies in the Penang area of Malaysia through the rapidly growing organisation “Dreamcatcher” that includes Intel, Agilent and Altera. I have also built a new CPD course in Microfluidics and run a UK company, EnablingMNT, UK that is part of the EnablingMNT group with offices in Germany and Holland.

Development of a multi frequency impedance measurement system for use in MEMS flow cytometers
Richardson, A.M.D., Cole, N., Abdul‑Hafiz, A. 12/2017 In: Microsystem Technologies. 23, 12, p. 5527-5543. 17 p.
Journal article

A housekeeping prognostic health management framework for microfluidic systems
Khan, H., Al-Gayem, Q., Richardson, A.M.D. 1/06/2017 In: IEEE Transactions on Device and Materials Reliability. 17, 2, p. 438-439. 12 p.
Journal article

Use of self-calibration data for multifunctional MEMS sensor prognostics
Khan, H., Tahir, M.I., Richardson, A.M.D. 08/2016 In: IEEE Journal of Micromechanical Systems. 25, 4, p. 761-769. 9 p.
Journal article

Scanning the strength of a test signal to monitor electrode degradation within bio-fluidic microsystems
Al-Gayem, Q., Liu, H., Khan, H., Richardson, A. 2013 In: On-Line Testing Symposium (IOLTS), 2013 IEEE 19th International. IEEE p. 133-138. 6 p.
Paper

Move from Online Test to Fault-tolerant: Design and Simulation of a Multi-Functional MEMS Sensor
Xu, Z., Richardson, A., Begbie, M., Wang, C. 16/05/2011 In: Proceedings of the IEEE International Mixed Signals, Sensors and Systems Test Workshop. USA : IEEE COMPUTER SOC p. 88-95. 8 p. ISBN: 978-1-4577-1144-2 .
Conference contribution

An oscillation-based technique for degradation monitoring of sensing and actuation electrodes within microfluidic systems.
Al-Gayem, Q., Richardson, A., Liu, H., Burd, N. 02/2011 In: Journal of Electronic Testing. 27, 3, p. 375-387. 13 p.
Journal article

Test strategies for electrode degradation in bio-fluidic microsystems.
Al-Gayem, Q., Honguan, L., Richardson, A., Burd, N. 02/2011 In: Journal of Electronic Testing. 27, 1, p. 57-68. 12 p.
Journal article

An on-line monitoring technique for electrode degradation in bio-fluidic microsystems.
Al-Gayem, Q., Liu, H., Richardson, A.M.D., Burd, N., Kumar, M. 10/2010 In: Proceedings of the 2010 IEEE International Test Conference (ITC). Austin, Texas : IEEE p. 1-10. 10 p. ISBN: 978-1-4244-7206-2.
Chapter

A multi-mode MEMS sensor design to support system test and health & usage monitoring applications
Xu, Z., Richardson, A., Koltsov, D., Li, L., Begbie, M., Wang, C. 1/05/2010 In: Test Symposium (ETS), 2010 15th IEEE European. p. 263. 1 p.
Conference contribution

Design and simulation of a multi-function MEMS sensor for health and usage monitoring.
Xu, Z., Kotsov, D., Richardson, A., Li, L., Begbie, M. 12/01/2010 In: Proceedings of IEEE Prognostics & System Health Management Conference. p. 1-7. 7 p.
Journal article

Integrated sensors for health monitoring in advanced electronic systems
Wang, C., Liu, Y., Desmulliez, M., Richardson, A. 1/11/2009 In: Design and Test Workshop (IDT), 2009 4th International. IEEE p. 1-6. 6 p. ISBN: 978-1-4244-5748-9 .
Conference contribution

Special Issue: Mixed-Technology Testing
Lubaszewski, M., Richardson, A., Su, C.C. 07/2009 In: Microelectronics Journal. 40, 7, 1 p.
Editorial

Built-in Test Solutions for the Electrode Structures in Bio-Fluidic Microsystems
Al-Gayem, Q., Liu, H., Richardson, A., Burd, N. 2009 In: ETS 2009: EUROPEAN TEST SYMPOSIUM, PROCEEDINGS. LOS ALAMITOS : IEEE COMPUTER SOC p. 73-78. 6 p. ISBN: 978-0-7695-3703-0.
Conference contribution

Health monitoring of aircraft wiring by acoustic method
Saha, S., Xu, Z., Koltsov, D., Richardson, A., Sutherland, A. 2009 In: 2009 IEEE AEROSPACE CONFERENCE, VOLS 1-7. NEW YORK : IEEE p. 3744-3753. 10 p. ISBN: 978-1-4244-2621-8.
Conference contribution

Online Testing of MEMS Based on Encoded Stimulus Superposition.
Dumas, N., Xu, Z., Georgopolis, K., Bunyan, J., Richardson, A. 12/2008 In: Journal of Electronic Testing. 24, 6, p. 555-566. 12 p.
Journal article

Microsystems for structural health monitoring.
Richardson, A., Van Heeren, H., Neylon, S. 10/2008 European Commission.
Commissioned report

Acoustic system for online wiring test on aircraft.
Xu, Z., Koltsov, D., Richardson, A., Sutherland, A. 18/06/2008 In: IEEE 14th International Mixed-Signals, Sensors, and Systems Test Workshop, 2008. IMS3TW 2008.. IEEE p. 1-4. 4 p. ISBN: 978-1-4244-2395-8.
Chapter

Failure mechanisms of legacy aircraft wiring and interconnects
Moffat, B.G., Abraham, E., Desmulliez, M.P.Y., Koltsov, D., Richardson, A. 06/2008 In: IEEE Transactions on Dielectrics and Electrical Insulation. 15, 3, p. 808-822. 15 p.
Journal article

Delivering Bio-Mems & Microfluidic Education Around Accessible Technologies
Richardson, A., Liu, H., Koltsov, D., Rosing, R., Ryan, T., Wooton, R. 28/05/2008 In: Proceedings of the 8th European Workshop on Microelectronics Education. EDA Publishing 2 p. Electronic ISBN: 978-2-35500-007-2.
Conference contribution

A Dependable Microelectronic Peptide Synthesizer Using Electrode Data
Richardson, A., Kerkhoff, H.G., Zhang, X., Mailly, F., Nouet, P., Liu, H. 2008 In: VLSI Design. 2008, n/a, 9 p.
Journal article

A novel method for test and calibration of capacitive accelerometers with a fully electrical setup
Dumas, N., Azaies, F., Mailly, F., Richardson, A., Nouet, P. 2008 In: Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on . LOS ALAMITOS : IEEE COMPUTER SOC p. 304-309. 6 p. ISBN: 978-1-4244-2276-0.
Conference contribution

An Embedded Test & Health Monitoring Strategy for Detecting and Locating Faults in Aerospace Bus Systems.
Hannu, J., Koltsov, D., Xu, Z., Richardson, A., Moilanen, M. 2008 In: Proceedings of the IEEE .
Journal article

Embedded Health Monitoring Strategies for Aircraft Wiring Systems
Xu, Z., Saha, S., Koltsov, D., Richardson, A., Honary, B., Hannu, J., Sutherland, A., Moffat, B.G., Desmulliez, M.P.Y. 2008 In: ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK : IEEE p. 463-469. 7 p. ISBN: 978-1-4244-2813-7.
Conference contribution

Embedded Test & Health Monitoring Strategies for Bio-Fluidic Microystems
Liu, H., Richardson, A., Harvey, T.G., Ryan, T., Pickering, C. 2008 In: ESTC 2008: 2ND ELECTRONICS SYSTEM-INTEGRATION TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS. NEW YORK : IEEE p. 427-433. 7 p. ISBN: 978-1-4244-2813-7.
Conference contribution

Model based design optimization of micromechanical systems, based on the Cosserat theory
Wiegand, T., Peters, D., Laur, R., Rosing, R., Richardson, A., Del Sarto, M., Baldo, L. 2008 In: PROCEEDINGS OF THE 11TH INTERNATIONAL CONFERENCE ON OPTIMIZATION OF ELECTRICAL AND ELECTRONIC EQUIPMENT, VOL I. NEW YORK : IEEE p. 33-38. 6 p. ISBN: 978-1-4244-1544-1.
Conference contribution

Phase Locked Loop Test Methodology
Richardson, A., Burbidge, M. 2008 In: Test and Diagnosis of Analogue, Mixed-signal and RF Integrated Circuits. Stevenage : IET Press p. 277-306. 30 p.
Chapter (peer-reviewed)

Test of A/D Converters
Richardson, A., Lechner, A. 2008 In: Test & Diagnostics of Analogue, Mixed Signal & RF Integrated Circuits. Stevenage : IET Press p. 213-234. 22 p.
Chapter (peer-reviewed)

Guest Editorial
Lubaszewski, M., Richardson, A., Su, C.C. 12/2007 In: Journal of Electronic Testing. 23, 6, 1 p.
Editorial

A fault-tolerant MEF peptide synthesizer using control and direct sensing electrodes employing current and impedance tests
Zhang, X., Kerkhoff, H.G., Mailly, F., Nouet, P., Liu, H., Richardson, A. 1/06/2007 In: 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop, Póvoa de Varzim, Portugal. Portugal : University of Porto p. 176-181. 6 p.
Conference contribution

Self-testing of micro-electrode array implemented as a bio-sensor
Liu, H., Dumas, N., Richardson, A. 1/06/2007 In: 13th International mixed signals testing workshop and 3rd international GHz/Gbps test workshop. Póvoa de Varzim, Portugal : IEEE Portugal section p. 166-170. 5 p.
Conference contribution

Sensor Testing Through Bias Superposition.
Richardson, A.M.D., Bunyan, R., Mathias, H., Nouet, P. 1/05/2007 In: Sensors and Actuators A: Physical. 136, 1, p. 441-455. 15 p.
Journal article

Online sensor testing through superposition of encoded stimulus.
Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, J., Richardson, A. 04/2007 In: Proceedings of the Design, Test, Integration and Packaging of MEMS/MOEMS, Stresa, Lago Maggiore, Italy, 25-27 April 2007.. 6 p. ISBN: 978-2-3550-0000-3.
Conference contribution

System in Package Technology - Design for Manufacture Challenges.
Richardson, A.M.D., Bailey, C., Dumas, N., Yannou, J.M. 1/02/2007 In: Circuit World. 33, 1, p. 36-46. 11 p.
Journal article

A novel approach for online sensor testing based on an encoded test stimulus
Dumas, N., Xu, Z., Georgopoulos, K., Bunyan, R.J.T., Richardson, A. 2007 In: ETS 2007: 12th IEEE European Test Symposium, Proceedings. LOS ALAMITOS : IEEE COMPUTER SOC p. 105-110. 6 p. ISBN: 978-0-7695-2827-4.
Conference contribution

Guest editorial.
Richardson, A.M.D., Mir, S., Cheng, T. 12/2006 In: Journal of Electronic Testing. 22, 4-6, p. 311.
Journal article

Investigation into the use of hybrid solutions for high resolution A/D converter testing.
Lechner, A., Georgopoulos, K., Burbidge, M., Richardson, A. 12/2006 In: Journal of Electronic Testing. 22, 4-6, p. 359-370. 12 p.
Journal article

A capacitance and optical method for the static and dynamic characterization of micro electro mechanical systems (MEMS) devices.
Richardson, A.M.D., Ferraris, E., Fassi, I., De Masi, B., Rosing, R. 1/09/2006 In: Microsystem Technologies. 12, 10-11, p. 1053-1061. 9 p.
Journal article

Built-in test of electrode degradation of multi-electrode array biosensors
Liu, H., Dumas, N., Richardson, A., Heal, R., Kerkhoff, H.G. 1/06/2006 In: Proceedings of the 12th IEEE International mixed signal testing workshop (IMSTW'06), Edinburgh, United Kingdom. Lancaster, UK : ISLI en Lancaster University p. 136-141. 6 p.
Conference contribution

Towards a health monitor for system in package with MEMS functionality.
Dumas, N., Richardson, A. 06/2006
Conference paper

Design for Micro and Nano Manufacture; The "PATENT-DfMM Network of Excellence: Modelling and Simulation Cluster
Richardson, A., Slattery, O., Rencz, M. 1/04/2006 In: Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2006. EuroSime 2006. 7th International Conference on. p. 1 -5. 5 p.
Conference contribution

Bit-stream manipulation for SD modulator failure mode analysis.
Burbidge, M., Georgopoulos, K., Lechner, A., Richardson, A. 2006 In: Proceedings of the 11th IEEE European test symposium..
Chapter

Bringing Multi-Domain Functions to Intelligent Systems through MEMS Technology Platforms – The INTEGRAMplus Access Service.
Richardson, A., Pickering, C., McNie, M., Reeves, C., Schropfer, G., Knapp, H., Bosshard, C. 2006 In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 4, p. 38-40. 3 p.
Journal article

INTEGRAMplus : a new European service project providing development platforms for integrated micro-nano technologies and products.
Richardson, A.M.D., Pickering, C., McNie, M., Reeves, C.L. 2006 In: MST News (VDI/VDE Technologiezentrum Informationstechnic).
Journal article

Initial background search on piezoelectric weight measurement used in urimeter application.
Koltsov, D., Richardson, A. 2006
Working paper

MNT needs methodologies and software tools.
Richardson, A.M.D., Solomon, P., El-Fatatry, A. 2006 In: MST News (VDI/VDE Technologiezentrum Informationstechnic). 2, p. 16-35. 20 p.
Journal article

Modelling the behaviour of soldier joints for wafer level SIP.
Liu, H., Strusevich, N., Stoyanov, S., Bailey, C., Richardson, A.M.D., Dumas, N., Yannou, J.M., Georgel, V. 2006 In: Proceedings of the 8th IEEE electronics packaging technology conference..
Chapter

The integration of on-line monitoring and reconfiguration functions into a safety critical automotive electronic control unit.
Jeffery, C., Cutajar, R., Richardson, A.M.D., Prosser, S., Lickess, M., Riches, S. 08/2005 In: Journal of Electronic Testing. 21, 4, p. 405-416. 12 p.
Journal article

Design and Test of an Oscillation-based System Architecture for DNA Sensor Arrays
Liu, H., Kerkhoff, H.G., Richardson, A., Zhang, X., Nouet, P., Azais, F. 1/06/2005 In: Proceedings of 11th International Mixed Signal Test Workshop, Cannes, France. France : TIMA Laboratory p. 1-6. 6 p.
Conference contribution

Behavioural error injection, spectral analysis and error detection for a 4th order single-loop sigma-delta converter using Walsh transforms.
Georgopoulos, K., Burbidge, M., Lechner, A., Richardson, A.M.D. 2005 In: Proceedings of the ETS workshop on Testing of High Resolution Mixed Signal Interfaces.
Chapter

Bias superposition: an on-line test strategy for a MEMS based conductivity sensor
Jeffrey, C., Xu, Z., Richardson, A. 2005 In: ETS 2005:10th IEEE European Test Symposium, Proceedings. LOS ALAMITOS : IEEE COMPUTER SOC p. 88-93. 6 p. ISBN: 0-7695-2341-2.
Conference contribution

Design Considerations for On-line Testing of a Capacitive Accelerometer.
Jeffery, C., Bunyan, R.J.T., Combes, D., King, D.O., Richardson, A.M.D. 2005 In: Proceedings of the 11th IEEE International Mixed-Signals Testing Workshop. p. 220-223. 4 p.
Chapter

Investigation into the Use of Alternative Transformation Techniques for High-Resolution A/D Converter Testing.
Georgopoulos, K., Burbidge, M., Lechner, A., Richardson, A.M.D. 2005 In: Proceedings of the IEEE Mixed Signal Test Workshop.
Chapter

The integration of on-line monitoring and reconfiguration functions using IEEE1149.4 into a safety critical automotive electronic control unit.
Jeffery, C., Cutajar, R., Richardson, A.M.D., Prosser, S., Lickess, M., Riches, S. 2005 In: Proceedings of Design, Automation and Test in Europe, 2005.. p. 153-158. 6 p.
Chapter

Using bias superposition to test a thick film conductance sensor.
Jeffery, C., Zhou, X., Richardson, A.M.D. 2005 In: Journal of Physics: Conference Series. 15, p. 161-166. 6 p.
Journal article

VHDL-AMS fault simulation for testing DNA bio-sensing arrays
Kerkhoff, H.G., Zhang, X., Liu, H., Richardson, A., Nouet, P., Azais, F. 2005 In: 2005 IEEE SENSORS. NEW YORK : IEEE p. 1030-1033. 4 p. ISBN: 0-7803-9056-3.
Conference contribution

Construction of Nonlinear Dynamic MEMS Component Models Using Cosserat Theory.
Richardson, A., De Masi, B., Rosing, R., Wang, C. 1/08/2004 In: Analog Integrated Circuits and Signal Processing. 40, 2, p. 117-130. 14 p.
Journal article

Testing high resolution SD ADC’s by using the noise transfer function
Richardson, A., De-Venuto, D. 26/05/2004
Conference paper

Flexible embedded test solution for high-speed analogue front-end architectures.
Lechner, A., Burbidge, M.J., Richardson, A.M.D. 2004 In: IEE Proceedings - Circuits, Devices and Systems. 151, 4, p. 359-369. 11 p.
Journal article

Motivations and techniques of built in self-test for embedded frequency synthesis systems incorporating charge pump phase-locked loops.
Burbidge, M., Lechner, A., Bell, G., Richardson, A.M.D. 2004 In: IEE proceedings - circuits, devices and systems. p. 337-348. 12 p.
Chapter

Techniques for automatic on chip closed loop transfer function monitoring for embedded charge pump phase locked loops.
Burbidge, M.J., Tijou, J., Richardson, A.M.D. 19/12/2003 In: Design, Automation and Test in Europe Conference and Exhibition, 2003. p. 496-501. 6 p. ISBN: 0-7695-1870-2.
Chapter

Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.
Burbidge, M.J., Poullet, F., Tijou, J., Richardson, A.M.D. 08/2003 In: Journal of Electronic Testing. 19, 4, p. 481-490. 10 p.
Journal article

Construction of nonlinear dynamic MEMS component models using cosserat theory.
Wang, C., Richardson, A.M.D., Liu, D., Rosing, R., Tucker, R., De Masi, B. 05/2003 In: Proceedings of the SPIE design, test, integration and packaging of MEMS symposium. France : Cannes Mandelieu
Chapter

Evaluation and detection of deterministic jitter causes in CP-PLLs due to macro level faults and pre-detection using simple methods.
Burbidge, M.J., Lechner, A., Richardson, A.M.D. 2003 In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 157-164. 8 p.
Journal article

Investigations into testability improvements on a 16 bit audio sigma-delta ADC through the use of on-chip techniques.
De Venuto, D., Compagne, E., Richardson, A.M.D. 2003 In: Proceedings of IMSTW 2003.
Chapter

Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers.
Burbidge, M.J., Tijou, J., Richardson, A.M.D. 2003 In: Journal of Electronic Testing.
Journal article

Modelling techniques for reliability prediction in MEMS technologies.
Rosing, R., Richardson, A.M.D. 2003 In: Proceedings of the Nanotech 2003 conference.
Chapter

Online monitoring for automotive sub-systems using 1149.4.
Jeffrey, C., Lechner, A., Richardson, A.M.D. 2003 In: EPRINTS-BOOK-TITLE.
Chapter

Re-using IEEE1149.4 as an infrastructure for online monitoring.
Jeffrey, C., Lechner, A., Richardson, A.M.D. 2003 In: Proceedings of the 9th IEEE international mixed signal test workshop (IMSTW03). p. 247-249. 3 p.
Chapter

Investigations of automatic built in transient step response monitoring for embedded second order charge pump phase locked loop frequency synthesizers
Richardson, A., Tijou, J., Burbidge, M., Vaid, V. 21/06/2002
Conference paper

Reconfigurable circuits for fault tolerant systems: factors to consider
Richardson, A., Jeffrey, C., Lechner, A. 21/06/2002
Conference paper

Generation of MEMS component models using Cosserat symbolic simulations
Rosing, R., Wang, C., Tucker, R., Richardson, A., De Masi, B. 2002 In: SPIE Proceedings. p. 149-154. 6 p.
Paper

Generation of component level fault models for MEMS
Rosing, R., Reichenbach, R., Richardson, A. 2002 In: Microelectronics Journal. 33, 10, p. 861-868. 8 p.
Journal article

Investigations for minimum invasion digital only built in ‘ramp’ based test techniques for charge pump PLLs.
Burbidge, M.J., Tijou, J., Poullet, F., Richardson, A.M.D. 2002 In: Proceedings of the Seventh IEEE European Test Workshop, 2002.. IEEE p. 95-102. 8 p. ISBN: 0-7695-1715-3.
Chapter

3DB challenge for DfT, DfM, DOT and BIST integration into analogue and mixed signal ICs.
Lechner, A., Burbidge, M.J., Richardson, A.M.D., Hermes, B. 2001 In: Proceedings of the 2nd Latin-American test workshop (LATW ’01). p. 194-199. 6 p.
Chapter

A failure mode analysis of a 6-bit folding ADCs.
Lechner, A., Richardson, A.M.D., Burbidge, M., Hermes, B. 2001 In: Proceedings of the 7th IEEE international mixed-signal testing workshop (IMSTW ’01). p. 19-23. 5 p.
Chapter

Finite element analysis to support component level fault modelling for MEMS.
Reichenbach, R., Rosing, R., Richardson, A.M.D., Dorey, A.P. 2001 In: Proceedings of SPIE design, test, integration and packaging of MEMS symposium. p. 147-158. 12 p.
Chapter

Generation of component level fault models for MEMS.
Rosing, R., Reichenbach, R., Richardson, A.M.D., Dorey, A.P. 2001 In: Proceedings of the 7th international mixed-signal testing workshop (IMSTW ’01). p. 40-45. 6 p.
Chapter

Short circuit faults in state-of-the-art ADCs – are they hard or soft?
Lechner, A., Richardson, A.M.D., Hermes, B. 2001 In: 10th Asian Test Symposium : proceedings . IEEE Computer Society p. 417-422. 6 p. ISBN: 0769513786 9780769513782 .
Chapter

Simple digital only test approach for embedded charge-pump phase-locked loops.
Burbidge, M., Richardson, A.M.D. 2001 In: Electronics Letters. 37, 22, p. 1318-1319. 2 p.
Journal article

Test techniques for embedded charge pump phase-locked loops: problems, current BIST techniques and alternative suggestions.
Burbidge, M., Richardson, A.M.D., Lechner, A. 2001 In: Proceedings of the 7th IEEE international test workshop. p. 97-102. 6 p.
Chapter

Towards a better understanding of failure modes and test requirements of ADCs.
Lechner, A., Richardson, A.M.D., Hermes, B. 2001 In: Proceedings of a conference: automation and test in Europe (DATE ’01). p. 803.
Chapter

A built-in test solution for a SMART silicon micromachined resonant pressure sensor.
Jeffery, C., Rosing, R., Richardson, A.M.D. 2000 In: IEEE European Test Workshop. IEEE ISBN: 0-7695-0701-8..
Chapter

A fault simulation methodology for MEMS.
Rosing, R., Richardson, A.M.D., Dorey, A.P. 2000 In: Proceedings of the design automation and test in Europe conference. Paris : IEEE p. 476-483. 8 p. ISBN: 0-7695-0537-6..
Chapter

A fault simulation methodology for MEMS.
Rosing, R., Richardson, A.M.D., Dorey, A.P. 2000 In: Proceedings of the IEE symposium on quality and automation (RESQUA 2000). Penang, Malaysia
Chapter

Applications of mixed signal test strategies to next generation microsystems.
Jeffery, C., Rosing, R., Richardson, A.M.D. 2000 In: Design, modeling, and simulation in microelectronics. SPIE (Society of Photo-Optical Instrumentation Engineers) p. 21-32. 12 p. ISBN: 0-8194-3900-2..
Chapter

Design-for-testability for mixed signal and analogue design.
Richardson, A.M.D., Lechner, A. 2000 In: Proceedings of 7th international conference on mixed design of integrated circuits and systems. Poland
Chapter

Fault simulation and modelling of microelectromechanical systems.
Rosing, R., Lechner, A., Richardson, A.M.D., Dorey, A.P. 2000 In: IEE Journal on Computing and Control Engineering. 11, 5, p. 242-250. 9 p.
Journal article

Reconfiguration based built-in self-test for analogue front-end circuits
Richardson, A., Lechner, A., Hermes, B. 18/06/1999
Conference paper

Test support strategies for MEMS
Richardson, A., Rosing, R., Peyton, A., Dorey, A. 18/06/1999
Conference paper

The application of neuMOS transistors to enhanced Built-in Self-Test (BIST) and product quality
Richardson, A., Nicholson, R. 18/06/1999
Conference paper

Fault simulation for MEMS
Rosing, R., Richardson, A., Dorey, A., Peyton, A. 1/06/1999 In: Intelligent and Self-Validating Sensors (Ref. No. 1999/160), IEE Colloquium on. p. 7/1 -7/6.
Conference contribution

A digital partial built-in self-test structure for a high performance automatic gain control circuit
Lechner, A., Ferguson, J., Richardson, A., Hermes, B. 1999 In: DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS. LOS ALAMITOS : IEEE COMPUTER SOC p. 232-238. 7 p. ISBN: 0-7695-0078-1.
Conference contribution

An Integrated Diagnostic Reconfiguration (IDR) design approach for fault tolerant mixed signal integrated systems
Richardson, A., Sharif, E., Dorey, A. 11/06/1998
Conference paper

A design for testability study on a high performance automatic gain control circuit.
Lechner, A., Richardson, A.M.D., Hermes, B., Ohletz, M. 1998 In: Proceedings of the 16th IEEE VLSI test symposium. IEEE p. 376-385. 10 p.
Chapter

An approach to realistic fault prediction and layout design for testability in analog circuits
Prieto, J.A., Rueda, A., Grout, I., Peralias, E., Huertas, J.L., Richardson, A.M.D. 1998 In: Design, Automation and Test in Europe, 1998 Proceedings. LOS ALAMITOS : IEEE COMPUTER SOC p. 905-909. 5 p. ISBN: 0-8186-8359-7.
Conference contribution

An approach to realistic fault prediction and layout design for testability in analogue circuits.
Prieto, J., Richardson, A.M.D., Rueda, A., Grout, I. 1998 In: Proceedings of the conference on design, automation and test in Europe. Paris p. 906-912. 7 p.
Chapter

An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems.
Sharif, E., Dorey, A.P., Richardson, A.M.D. 1998 In: Proceedings of the IEEE international circuits and systems symposium. IEEE
Chapter

Clock switching: a new design for current test (DcT) method for dynamic logic circuits
Rosing, R., Richardson, A.M.D., Kerkhoff, A., Acosta, A. 1998 In: IDDQ Testing, 1998. Proceedings. 1998 IEEE International Workshop on. IEEE p. 20-25. 6 p.
Paper

Design for testability strategies for a high performance gain control circuit.
Lechner, A., Richardson, A.M.D., Hermes, B., Perkins, A. 1998 In: Proceedings of the international IEEE mixed signal test workshop. The Hague
Chapter

Design for testability strategies for mixed signal and analogue designs: from layout to system.
Richardson, A.M.D., Lechner, A., Olbrich, T. 1998 In: Proceedings of the 5th IEEE international conference on electronics, circuits and systems. Lisbon p. 425-433. 9 p.
Chapter

Reconfigurable smart sensors for dependable systems
Sharif, E., Richardson, A., Dorey, T. 1/11/1997 In: Hardware Systems for Dependable Applications (Digest No: 1997/335), IEE Half-Day Colloquium on. IEEE p. 2/1 -2/6. 6 p.
Conference contribution

Integrating testability into microsystems
Olbrich, T., Richardson, A., Vermeiren, W., Straube, B. 02/1997 In: Microsystem Technologies. 3, 2, p. 72-79. 8 p.
Journal article

A new methodology for IC product quality estimation.
Olbrich, T., Grout, I., Eben Aimine, Y., Richardson, A., Contensou, J. 1997 In: Proceedings of the European design and test conference (ED&TC '97). Paris : IEEE Computer Society Press ISBN: 0818677864..
Chapter

A new quality estimation methodology for mixed-signal and analogue ICs
Olbrich, T., Grout, I.A., Aimine, Y.E., Richardson, A.M., Contensou, J. 1997 In: European Design and Test Conference, 1997. ED&TC 97. Proceedings . LOS ALAMITOS : I E E E, COMPUTER SOC PRESS p. 573-580. 8 p. ISBN: 0-8186-7786-4.
Conference contribution

Current-mode techniques for self-testing analogue circuits
Baturone, I., SanchezSolano, S., Richardson, A.M., Huertas, J.L. 1997 In: IDDQ Testing, 1997. Digest of Papers., IEEE International Workshop on . LOS ALAMITOS : I E E E, COMPUTER SOC PRESS p. 33-37. 5 p. ISBN: 0-8186-8123-3.
Conference contribution

Fault-tolerant and self-testable architectures for zero failure electronics
Richardson, A., Sharif, E., Betts, W.R. 1997 In: AUTOMOTIVE ELECTRONICS - AUTOTECH'97. EDMUNDS : MECHANICAL ENGINEERING PUBL p. 133-142. 10 p. ISBN: 1860581153 9781860581151.
Conference contribution

Design-for-test (DfT) study on a current mode DAC
Olbrich, T., Mozuelos, R., Richardson, A., Bracho, S. 12/1996 In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 374-379. 6 p.
Journal article

Editorial: Mixed signal & analogue IC test technology
Richardson, A., Dorey, T. 12/1996 In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, 1 p.
Editorial

Mixed signal test - Techniques, applications and demands
Baker, K., Richardson, A.M., Dorey, A.P. 12/1996 In: IEE Proceedings - Circuits, Devices and Systems. 143, 6, p. 358-365. 8 p.
Journal article

Integrated Test Support for Micro- Electro-Mechanical-Systems (MEMS)
Richardson, A., Vermeiren, W., Straube, B., Olbrich, T. 19/09/1996
Conference paper

Built-in self-test and diagnostic support for safety critical microsystems
Olbrich, T., Richardson, A.M.D., Bradley, D.A. 07/1996 In: Microelectronics Reliability. 36, 7-8, p. 1125-1136. 12 p.
Journal article

Built-In Self-Test in Intelligent Microsystems as a Contributor to System Quality and Performance
Olbrich, T., Bradley, D.A., Richardson, A.M.D. 1/06/1996 In: Quality Engineering. 8, 4, p. 601-613. 13 p.
Journal article

Defect-oriented vs. chematic-level based fault simulation for mixed-signal ICs.
Olbrich, T., Perez, J., Grout, I., Richardson, A., Ferrer, C. 1996 In: Proceedings of the international test conference 1996. Washington DC p. 511-520. 10 p. ISBN: 0780335406.
Chapter

Design and self-test for switched-current building blocks
Olbrich, T., Richardson, A. 1996 In: IEEE Design and Test of Computers. 13, 2, p. 10-17. 8 p.
Journal article

Design-for-test strategies for analogue and mixed-signal integrated circuits
Olbrich, T., Liberali, V., Maloberti, F., Richardson, A. 1996 In: 38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2. NEW YORK : Eubios Ethics Institute p. 1139-1144. 6 p. ISBN: 0-7803-2973-2.
Conference contribution

Supply Current Monitoring for Testing CMOS Analog Circuits
Baturone, I., Huertas, J.L., Solano, S.S., Richardson, A.M. 1996
Other contribution

PRACTICAL DFT STRATEGY FOR FAULT-DIAGNOSIS IN ACTIVE ANALOG FILTERS
VAZQUEZ, D., RUEDA, A., HUERTAS, J.L., RICHARDSON, A.M.D. 20/07/1995 In: Electronics Letters. 31, 15, p. 1221-1222. 2 p.
Journal article

Defect oriented test development based on inductive fault analysis
Richardson, A., Kerkhoff, H.G., Harvey, R. 22/06/1995
Conference paper

The application of IDDX test strategies in analogue and mixed signal IC's
Richardson, A., Bratt, A., Baturone, I., HUERTAS, J.L. 22/06/1995
Conference paper

A design-for-test structure for optimising analogue and mixed signal IC test
Bratt, A., Richardson, A.M.D., Harvey, R., Dorey, A.P. 03/1995 In: European Design and Test Conference. IEEE p. 24-33. 10 p.
Chapter

AC analysis of time discrete systems
Olbrich, T., Harvey, R., Richardson, A. 1995 In: IEE Seminar Digests. 1995, 192, p. 1. 1 p.
Journal article

Analogue Fault Simulation Based on Layout-Dependent Fault Models.
Harvey, R., Richardson, A.M.D., Baker, K., Bruls, E. 1994 In: Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years. Washington, DC, USA : IEEE Computer Society p. 641-649. 9 p. ISBN: 0-7803-2103-0..
Chapter

BIST and diagnostics for microsystems.
Olbrich, T., Bradley, D.A., Richardson, A.M.D. 1994 In: Proceedings of the 7th ISATA conference: dedicated conferences on mechatronics and supercomputing applications in the transportation industries. Croydon : Automotive Automation p. 575-580. 6 p.
Chapter

BIST and diagnostics for safety critical microsystems.
Olbrich, T., Richardson, A.M.D., Bradley, D.A. 1994 In: Proceedings of an ESREF conference. Glasgow p. 511-518. 8 p.
Chapter

Development of class 1 QTAG monitor.
Bratt, A., Baker, K., Richardson, A.M.D., Welbers, A. 1994 In: Proceedings of an international test conference: the next 25 years. IEEE Service Centre
Chapter

Self-test and diagnostics for smart sensors in automotive applications.
Olbrich, T., Bradley, D.A., Richardson, A.M.D. 1994 In: Proceedings of the IEE colloquium on automotive sensors. p. 3/1-4.
Chapter

Aspects of current reference generation and distribution for IDDx pass/fail current determination.
Bratt, A., Harvey, R.J.A., Dorey, A.P., Richardson, A.M.D. 1993 In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London
Chapter

Design-for-test structure to facilitate test vector application with low performance loss in non-test mode.
Bratt, A., Harvey, R.J.A., Dorey, A.P., Richardson, A.M.D. 1993 In: Electronics Letters. 29, 16, p. 1438-1440. 3 p.
Journal article

Test evaluation for complex mixed signal ICs by introducing layout dependent faults.
Harvey, R.J.A., Richardson, A.M.D., Bruls, E.M.J., Baker, K. 1993 In: Proceedings of the IEE colloquium on mixed signal VLSI test, digest No 1993/240. London p. 6/1-8.
Chapter

Reliability indicators.
Richardson, A.M.D., Dorey, A.P. 1992 In: Third European symposium of reliability of electron devices, failure, physics and analysis (ESREF). Schabisch Gmund p. 277-285. 9 p.
Chapter

Supply current monitoring in cmos circuits for reliability prediction and test.
Richardson, A.M.D., Dorey, A.P. 1992 In: Quality and Reliability Engineering International. 8, 6, p. 543-548. 6 p.
Journal article