Dr Alexander Robson

ERDF Technology Access Consultant (Physics)

Research Overview

I am an ERDF Technology Access Consultant based in the Department of Physics, working on the Cumbria Innovations Platform (CUSP) project, a new initiative that helps Cumbrian SMEs to access technical and management expertise from Lancaster University and the University of Cumbria to accelerate innovation in new products and services.

In particular, my role facilitates engagements with the Department of Physics and the Quantum Technology Centre, allowing businesses to engage with world class facilities featuring state-of-the-art nanofabrication and measurement equipment.

Research Interests

· Cross-sectional analysis of materials via beam-exit cross-sectional polishing, a technique developed and patented by Lancaster University.

· Quantitative nanoscale mapping of materials via scanning probe microscopy, including nanomechanical and nanothermal properties.

· Nanoscale materials, structures and devices, 2D materials and their applications.


Prior to my current appointment, I worked as a senior research associate on the European Commission project QUANTIHEAT (QUANTItative scanning probe microscopy techniques for HEAT transfer management in nanomaterials and nanodevices, FP&-NMP-2013-LARGE-7), which involved twenty partner institutes in academic and industrial fields. The QUANTIHEAT project aims to tackle issues relating to thermal metrology at the nanoscale and to deliver validated standards, methods and modelling tools.

Before joining the QUANTHEAT project, much of my research focused on the cross-sectional analysis of III-V compound semiconductor materials and devices via scanning probe microscopy and beam-exit cross-sectional polishing (BEXP), a technique developed at Lancaster University.

I have a PhD in Physics from Lancaster University, thesis title “Cross-Sectional Scanning Probe Microscopy of III-V Semiconductors” (Supervisor: Dr Manus Hayne).

Optical identification using imperfections in 2D materials
Cao, Y., Robson, A.J., Alharbi, A., Roberts, J., Woodhead, C., Noori, Y., Bernardo Gavito, R., Roedig, U., Falko, V., Young, R.J. 28/09/2017 In: 2D Materials. 4, 4, 8 p.
Journal article

Probing thermal transport and layering in disk media using scanning thermal microscopy
Poon, S.W., Spiece, J., Robson, A.J., Kolosov, O.V., Thompson, S. 15/08/2017 In: Magnetics Conference (INTERMAG), 2017 IEEE International. IEEE 2 p. ISBN: 9781538610879. Electronic ISBN: 9781538610862.
Conference contribution

SPM characterisation of nanomechanical proprieties of C60 monolayer formed by LB
Lamantia, A., Robson, A.J., Pinter, G., Underwood, K.L., Roberts, J., Cao, Y., Young, R.J., Robinson, B.J. 4/07/2017

Correlation of nano-scale electrical and topographical mapping of buried nanoscale semiconductor junctions
Alsharif, G., Hanel, L., Robson, A.J., Schultze, J., Robinson, B.J., Kolosov, O.V. 3/07/2017

Novel nanoscale method for thermal conductivity measurements
Kolosov, O.V., Spiece, J., Robson, A.J., Evangeli, C. 3/07/2017

Scanning Thermal Microscopy on 2D Materials at cryogenic temperatures
Evangeli, C., Spiece, J., Robson, A.J., Kay, N., Kolosov, O.V. 3/07/2017

Structural Characterisation of ALD coated Porous Si via Beam-Exit Cross-Sectional Polishing
Robson, A.J., Spiece, J., Evangeli, C., Ritasalo, R., Matvejeff, M., Grigoras, K., Prunnila, M., Kolosov, O.V. 3/07/2017

Quantitative Measurements of Intrinsic Thermal Conductivity of Surface and Buried Nanoscale Layers via Cross-Sectional Scanning Thermal Microscopy – X-SThM
Spiece, J., Evangeli, C., Robson, A.J., Robinson, B.J., Alzina, F., Kolosov, O.V. 1/03/2017

GaSb quantum rings in GaAs/AlxGa1−xAs quantum wells
Hodgson, P., Hayne, M., Robson, A., Zhuang, Q., Danos, E. 28/01/2016 In: Journal of Applied Physics. 119, 4, 7 p.
Journal article

Low leakage-current InAsSb nanowire photodetectors on silicon
Thompson, M.D., Alhodaib, A., Craig, A.P., Robson, A.J., Aziz, A., Krier, A., Svensson, J., Wernersson, L., Sanchez, A.M., Marshall, A.R.J. 13/01/2016 In: Nano Letters. 16, 1, p. 182-187. 6 p.
Journal article

Phonon bottleneck in GaAs/AlxGa1-xAs quantum dots
Chang, Y., Robson, A., Harrison, S., Zhuang, Q., Hayne, M. 22/06/2015 In: AIP Advances. 5, 6, 6 p.
Journal article

Nanometre scale 3D nanomechanical imaging of semiconductor structures from few nm to sub-micrometre depths
Kolosov, O., Dinelli, F., Robson, A., Krier, A., Hayne, M., Falko, V., Henini, M. 2015 In: IEEE 2015 International Interconnect Technology Conference / Materials for Advanced Metallization Conference. Grenoble, France : IEEE p. 43-46. 4 p.

Self-catalysed growth of InAs nanowires on bare Si substrates by droplet epitaxy
Anyebe, E., Zhuang, Q., Sanchez, A.M., Lawson, S., Robson, A., Ponomarenko, L.A., Zhukov, A., Kolosov, O. 11/07/2014 In: physica status solidi (RRL) - Rapid Research Letters. 8, 7, p. 658–662. 5 p.
Journal article

High-accuracy analysis of nanoscale semiconductor layers using beam-exit Ar-ion polishing and scanning probe microscopy
Robson, A., Grishin, I., Young, R., Sanchez, A.M., Kolosov, O., Hayne, M. 25/03/2013 In: ACS Applied Materials and Interfaces. 5, 8, p. 3241-3245. 5 p.
Journal article

Nanoscale SPM characterisation of nacre aragonite plates and synthetic human amyloid fibres
Grishin, I., Tinker, C., Allsop, D., Robson, A., Kolosov, O. 2012 In: NSTI-Nanotech 2012. Santa Clara, USA : CRC PRESS-TAYLOR & FRANCIS GROUP p. 110-113. 4 p.