Electron Microscopy

The electron-microscopy suite houses a Jeol JSM-5600 high vacuum Scanning Electron Microscope with secondary election detector and digital output, and a Jeol JEM-1010, high-contrast Transmission Electron Microscope, with an AMT CCD camera for digital imaging.

Jeol JSM-5600 SEM Scanning Electron Microscope

The Jeol JSM-5600 SEM, is a high vacuum SEM with tungsten filament electron source, Secondary Electron detector and digital output. Samples ranging up to 30mm in diameter can be examined with full coverage yielding surface morphology and topographic contract images.

  • Filament: a precentred Tungsten hairpin filament.
  • Detector type: Secondary Electron (SE) Detector.
  • Magnification range: 35 - 300,000 times.
  • Working distance 8 – 48mm
  • Accelerating voltages 0.5 – 30kV
  • Resolution in practise for biological samples 10nm (theoretically 3.5nm possible)
  • Tilt: -10o to +90o

Jeol JEM-1010 Transmission Electron Microscope

The Jeol JEM-1010 is a compact, high-contrast TEM with tungsten filament electron source and AMT CCD camera for digital image acquisition. Used to image whole mounts of small molecules, proteins, lipids, viruses etc, examination of cell ultrastructure in plant and animal tissue following ultrathin tissue sectioning as well as localisation of specific molecules by immunocytochemistry.

  • Filament: a Precentred Tungsten hairpin filament
  • Operating voltage 40 – 100kV
  • Magnification from 2000 – 200,000 times
  • Resolution for stained specimens around 1nm